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NI STS Solution
The NI Semiconductor Test System (STS) brings the long history and value of the industry-standard PXI platform to a production-ready ATE offering that can scale up to meet evolving test requirements or scale down to meet constricting budgets. Leverage the latest high-performance PXI instruments, such as the 1 GHz bandwidth Vector Signal Transceiver (VST), for performing demanding measurements on RF and mixed-signal ICs, while meeting all the operational needs of the semiconductor production environment.
Standard Features
- Drag-and-drop test step templates for common semiconductor test operations
- Interactive software for performing manual tests and debugging automated tests
- Calibration for RF instrumentation up to the blind-mates, and DC/Digital instrumentation up to the spring probe interface
- Test Sequencer: NI TestStand with TestStand Semiconductor Module
- Code Development: LabVIEW or C# .NET
- STS Maintenance Software
Optional Features
- High-power RF (+40 dBm transmit and receive)
- Harmonics measurement (up to 18 GHz)
- Noise figure measurement (with Y-factor and cold source support)
Test Head Features
- Zero footprint test head
- Manipulator interface kits for Reid Ashman, InTest, Esmo, Arktek, Asia Microhandling, and others
- Support for packaged device handlers and wafer probers (traditional tower probe and direct dock probe)
- 220 V power
- Fan cooled
- Standard spring pin layout
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